Structural, Syntactic, and Statistical Pattern Recognition Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006. Proceedings / edited by Dit-Yan Yeung, James T. Kwok, Ana Fred, Fabio Roli, Dick Ridder.
Material type: TextDescription: On-campus e-Book by Springer under Digital Library Program of Higher Education Commission (HEC) of PakistanISBN:- 9783540372417
Item type | Current library | Call number | Status | Date due | Barcode |
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e-Book | ICCBS Digital Library | Not for loan |