Normal view MARC view ISBD view

Characterization of High Tc Materials and Devices by Electron Microscopy

Browning, Nigel

Characterization of High Tc Materials and Devices by Electron Microscopy Browning, Nigel - Cambridge University Press 2000 - On-campus e-Book by ebrary under Digital Library Program of Higher Education Commission (HEC) of Pakistan

ISBN: 9780511155178

Subjects--Topical Terms:
Physical Science

Print
Save record
BIBTEX Dublin Core ISBD MARC (non-Unicode/MARC-8) MARCXML MODS (XML) RIS MARC (Unicode/UTF-8) MARC (Unicode/UTF-8, Standard)
More searches

Search for this title in:
Other Libraries (WorldCat) Other Databases (Google Scholar) Online Stores (Bookfinder.com) Open Library (openlibrary.org)

WELCOME TO THE ICCBS LIBRARIES CATALOG

Characterization of High Tc Materials and Devices by Electron Microscopy